Packaging Details | Standard package |
Delivery Time | within 3 days after receipt of advanced payment |
Payment Terms | T/T in advance |
Supply Ability | 50pcs/week |
Measuring range (mm) | 0.5~10000 |
Sensitivity margin | ≥62dB |
Dynamic scope | ≥34dB |
Dimension | 238mm×160mm×48mm |
Net weight | 1.0kg |
Continue working time | 12h |
Make video | Unlimited |
Warranty | 1 year |
Place of Origin | Made In China |
Brand Name | SADT |
Certification | ISO9001 |
Model Number | SUD50 |
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Product Specification
Packaging Details | Standard package | Delivery Time | within 3 days after receipt of advanced payment |
Payment Terms | T/T in advance | Supply Ability | 50pcs/week |
Measuring range (mm) | 0.5~10000 | Sensitivity margin | ≥62dB |
Dynamic scope | ≥34dB | Dimension | 238mm×160mm×48mm |
Net weight | 1.0kg | Continue working time | 12h |
Make video | Unlimited | Warranty | 1 year |
Place of Origin | Made In China | Brand Name | SADT |
Certification | ISO9001 | Model Number | SUD50 |
High Light | ultrasonic flaw detector ,digital flaw detector |
SUD series ultrasonic flaw detectors are portable, microprocessor-based instruments that are suitable for both shop and field use. They are integrated with international advanced digital integration and new EL display technology, are smart Digital Ultrasonic Flaw Detector propelled by SADT. SUD series flaw detectors have almost all functions to meet requirements of professional application for nondestructive testing.
SUD50 is a more portable model with better functions.
Features:
Technical Parameters
Designation | Technical Data |
Range of scanning (mm) | Range of scanning (mm): 0~10000 Steps: 2.5,5,10,20, 30,40,50,60,70,80,90, 100,150,200, 250, 300, 350, 400, 450,500,600,700,800,900,1000,2000,3000,4000,5000,6000,7000,8000,10000 Adjusting step: 0.1mm(2.5 mm~99.9mm), 1mm(100mm~10000mm) |
D-delay (µs) | D-delay (µs): -20~+3400 Steps: -20,-10,0.0, 10, 20, 50,100,150,200,250,300,350,400,450,500, 600, 700,800,900,1000,1500,2000,2500,3000,3400. Adjusting steps: 0.1(-20µs~999.9µs), 1(1000µs~3400µs) |
P-delay (µs) | P-delay: 0.0~99.99 Adjusting steps: 0.01 |
MTLVEL(m/s) | MTLVEL: 1000~15000 10 fixed levels: 2260,2730,3080,3230,4700,5920,630012000,13000,14000,15000 Adjusting steps: 1 |
Working mode | Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe) |
Frequency Range (MHz) | 0.5~20 |
Gain adjustment (dB) | 0~120 Adjusting step: 0.0, 0.1, 0.5, 1, 2, 6, 12 |
Reject | 0%~80% of screen height, step: 1% |
Vertical linear error | Vertical linear error is not more than 3% |
Horizontal linear error | Not more than 0.2% in the scanning range |
Sensitivity Leavings | ≥62 dB |
Dynamic range | ≥34dB |
Alarm | Three modes, i.e. forbidden wave, loss wave and auto |
A-Scan display area | Full screen or local A-Scan display freezing and de-freezing A-Scan filling |
Data save | 1000 A-Scan images (including setting of instrument) |
Standard communication interface with PC | RS232/USB |
Measuring unit | mm/inch |
Battery | Li battery 7.4V 4800mAh |
Power adaptor | Input 100V~240V/50Hz~60Hz Output 9VDC/1.5A |
Working temperature | -20℃~50℃ |
Working humidity | 20%~90% |
Port type | BNC |
Overall dimension (mm) | 50×160×238 |
Weight (kg) | 1.0 |
Company Details
Business Type:
Manufacturer,Distributor/Wholesaler,Importer,Exporter,Seller
Year Established:
1993
Total Annual:
3 million-4 million
Employee Number:
>30
Ecer Certification:
Active Member
Sino Age Development Technology, Ltd. (SADT), established in 1993, is a leading manufacturer for measuring and testing instrument, specialized in NDT and quality control fields. We have our own HARTIP series portable hardness testers since 1995. We are professional producer with ISO 9001 quality sys... Sino Age Development Technology, Ltd. (SADT), established in 1993, is a leading manufacturer for measuring and testing instrument, specialized in NDT and quality control fields. We have our own HARTIP series portable hardness testers since 1995. We are professional producer with ISO 9001 quality sys...
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