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Opto-Edu (Beijing) Co., Ltd.

  • China,Beijing ,Beijing
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China Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force
China Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force

  1. China Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force

Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force

  1. MOQ: 1pc
  2. Price: FOB $1~1000, Depend on Order Quantity
  3. Get Latest Price
Payment Terms L/C, T/T, Western Union
Supply Ability 5000 pcs/ Month
Delivery Time 5~20 Days
Packaging Details Carton Packing, For Export Transportation
Work Mode "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
Current Spectrum Curve "RMS-Z Curve F-Z Force Curve"
XY Scan Mode Sample Driven Scanning, Closed Loop Piezoelectric Shift Scanning Stage
XY Scan Range Closed Loop 100×100um
XY Scan Resolution Closed Loop 0.5nm
Z Scan Range 5um
Z Scan Resolution 0.05nm
Scan Speed 0.6Hz~30Hz
Scan Angle 0~360°
Sample Weight ≤15Kg
Stage Size "Dia.100mm 【Optional】 Dia.200mm Dia.300mm"
Stage XY Moving " 100x100mm, Resolution 1um 【Optional】 200x200mm 300x300mm"
Stage Z Moving "15mm, Resolution 10nm 【Optional】 20mm 25mm"
Shock-Absorbing Design "Spring Suspension 【Optional】 Active Shock Absorber"
Optical System "Objective 5x 5.0M Digital Camera 【Optional】 Objective 10x Objective 20x"
Brand Name OPTO-EDU
Model Number A62.4511
Certification CE, Rohs
Place of Origin China

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  1. Product Details
  2. Company Details

Product Specification

Payment Terms L/C, T/T, Western Union Supply Ability 5000 pcs/ Month
Delivery Time 5~20 Days Packaging Details Carton Packing, For Export Transportation
Work Mode "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode" Current Spectrum Curve "RMS-Z Curve F-Z Force Curve"
XY Scan Mode Sample Driven Scanning, Closed Loop Piezoelectric Shift Scanning Stage XY Scan Range Closed Loop 100×100um
XY Scan Resolution Closed Loop 0.5nm Z Scan Range 5um
Z Scan Resolution 0.05nm Scan Speed 0.6Hz~30Hz
Scan Angle 0~360° Sample Weight ≤15Kg
Stage Size "Dia.100mm 【Optional】 Dia.200mm Dia.300mm" Stage XY Moving " 100x100mm, Resolution 1um 【Optional】 200x200mm 300x300mm"
Stage Z Moving "15mm, Resolution 10nm 【Optional】 20mm 25mm" Shock-Absorbing Design "Spring Suspension 【Optional】 Active Shock Absorber"
Optical System "Objective 5x 5.0M Digital Camera 【Optional】 Objective 10x Objective 20x" Brand Name OPTO-EDU
Model Number A62.4511 Certification CE, Rohs
Place of Origin China
High Light opto edu scanning microscopemarble base scanning microscopeopto edu atomic force microscope

Plane Scanning Atomic Force Microscope

  • Gantry scanning head design, marble base, vacuum adsorption stage, sample size and weight are basically unlimited
  • A62.4510 + Closed-loop three-axis independent pressure shift scanner, which can scan with high precision in a wide range
  • Intelligent needle feeding method with automatic detection of motor-controlled piezoelectric ceramics to protect probes and samples
  • Automatic optical positioning, no need to adjust focus, real-time observation and positioning probe sample scanning area
  • Equipped with closed metal shield, pneumatic shock-absorbing table, strong anti-interference ability
  •       

          ◆ The first commercial atomic force microscope in China to realize combined mobile scanning of probe and sample;

          ◆ The first in China to use a three-axis independent closed-loop piezoelectric shift scanning table to achieve large-scale high-precision scanning;

          ◆ Three-axis independent scanning, XYZ does not affect each other, very suitable for three-dimensional material and topography detection;

          ◆ Electric control of sample moving table and lifting table, which can be programmed with multi-point position to realize fast automatic detection;

          ◆ Gantry scanning head design, marble base, vacuum adsorption and magnetic adsorption stage;

          ◆ The motor automatically controls the intelligent needle feeding method of the piezoelectric ceramic automatic detection to protect the probe and the sample;

          ◆ High magnification auxiliary optical microscope positioning, real-time observation and positioning of probe and sample scanning area;

          ◆ The closed-loop piezoelectric scanning stage does not require nonlinear correction, and the nanometer characterization and measurement accuracy is better than 99.5%.

  •   A62.4510 A62.4511
    Work Mode Contact Mode
    Tapping Mode

    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Contact Mode
    Tapping Mode

    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Current Spectrum Curve RMS-Z Curve
    F-Z Force Curve
    RMS-Z Curve
    F-Z Force Curve
    XY Scan Mode Probe Driven Scanning,
    Piezo Tube Scanner
    Sample Driven Scanning, Closed Loop Piezoelectric Shift Scanning Stage
    XY Scan Range 70×70um Closed Loop 100×100um
    XY Scan Resolution 0.2nm Closed Loop 0.5nm
    Z Scan Mode   Probe Driven Scanning
    Z Scan Range 5um 5um
    Z Scan Resolution 0.05nm 0.05nm
    Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz
    Scan Angle 0~360° 0~360°
    Sample Weight ≤15Kg ≤0.5Kg
    Stage Size Dia.100mm

    【Optional】
    Dia.200mm
    Dia.300mm
    Dia.100mm

    【Optional】
    Dia.200mm
    Dia.300mm
    Stage XY Moving 100x100mm, Resolution 1um

    【Optional】
    200x200mm
    300x300mm
    100x100mm, Resolution 1um

    【Optional】
    200x200mm
    300x300mm
    Stage Z Moving 15mm, Resolution 10nm
    【Optional】
    20mm
    25mm
    15mm, Resolution 10nm
    【Optional】
    20mm
    25mm
    Shock-Absorbing Design Spring Suspension

    【Optional】
    Active Shock Absorber
    Spring Suspension

    【Optional】
    Active Shock Absorber
    Optical System Objective 5x
    5.0M Digital Camera

    【Optional】
    Objective 10x
    Objective 20x
    Objective 5x
    5.0M Digital Camera

    【Optional】
    Objective 10x
    Objective 20x
    Output USB2.0/3.0 USB2.0/3.0
    Software Win XP/7/8/10 Win XP/7/8/10
    Main Body Gantry Scan Head, Marble Base Gantry Scan Head, Marble Base
  • Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
    Max Resolution (um) 0.18 0.00011 0.00008
    Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
     
  • Probe-Sample Interaction Measure Signal Information
    Force Electrostatic Force Shape
    Tunnel Current Current Shape, Conductivity
    Magnetic Force Phase Magnetic Structure
    Electrostatic Force Phase charge distribution
  •   Resolution Working Condition Working Temperation Damge to Sample Inspection Depth
    SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperation None 1~2 Atom Level
    TEM Point 0.3~0.5nm
    Lattice 0.1~0.2nm
    High Vaccum Room Temperation Small Usually <100nm
    SEM 6-10nm High Vaccum Room Temperation Small 10mm @10x
    1um @10000x
    FIM Atom Level 0.1nm Super High Vaccum 30~80K Damge Atom Thickness
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Company Details

Bronze Gleitlager

,

Bronze Sleeve Bushings

 and 

Graphite Plugged Bushings

 from Quality China Factory
  • Business Type:

    Manufacturer,Distributor/Wholesaler,Exporter,Trading Company,Seller

  • Year Established:

    1995

  • Total Annual:

    6000000-8000000

  • Employee Number:

    10~20

  • Ecer Certification:

    Verified Supplier

Opto-Edu (Beijing) Co., Ltd.,as one of the leading supplier of optical & educational products from China, we have concentrated in this field for more than 10 years. We have been collecting and supplying different products for our customers all over the world. We have the most ... Opto-Edu (Beijing) Co., Ltd.,as one of the leading supplier of optical & educational products from China, we have concentrated in this field for more than 10 years. We have been collecting and supplying different products for our customers all over the world. We have the most ...

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  • Opto-Edu (Beijing) Co., Ltd.
  • F-1501 Wanda Plaza, No. 18 Shijingshan Road, Beijing 100043, China
  • https://www.cnoec.com/

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